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Atomic-force microscopy
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171	Efficient PV blends comprising more than two semiconductors Lacramioara Popescu,2 Patrick van ‘t Hof1, Floris Kooistra2, David Kronholm1, Alexander B. Sieval1, and Jan C. Hummelen2* 1. Solenne BV, Zernikepark 12 ,9747 Add to Reading List Source URL: www.quantsol.org Language: English - Date: 2010-05-11 12:44:47 Technology Solar cell Materials science N-type semiconductor Photoconductive atomic force microscopy Carbon nanotubes in photovoltaics Fullerenes Chemistry Phenyl-C61-butyric acid methyl ester
172	Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Magnetic force microscope Near-field scanning optical microscope Microscopy Park Systems Kelvin probe force microscope Scanning tunneling microscope Microscope Atomic force microscopy Scanning probe microscopy Science Scientific method
173	Nanotechnology Solutions Partner Park Systems Singapore. 33, Ubi Avenue 3, #07-47 Vertex Tower A SingaporeTel: +Mobile: +www.parkAFM.com © 2011 Park Systems Corp. All rights reserved. Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Intermolecular forces Chemistry Atomic force microscopy Nanotechnology Park Systems Scanning electron microscope Nanometrology Vibrational analysis with scanning probe microscopy Magnetic force microscope Scientific method Science Scanning probe microscopy
174	Dimension FastScan The World’s Fastest AFM Innovation with Integrity Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2013-10-28 06:25:22 Chemistry Atomic force microscopy Magnetic force microscope Microscopy Conductive atomic force microscopy Scanning capacitance microscopy Nanoindentation Scanning tunneling microscope Microscope Scanning probe microscopy Science Scientific method
175	Critical Dimensions Measurement of High Aspect Ratio Trench with XE AFM >>> Figure 1. (a) XE Scan System separates the Z-scanner from Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Intermolecular forces Atomic force microscopy Park Systems Microscopy Image scanner Vibrational analysis with scanning probe microscopy NanoWorld Science Scientific method Scanning probe microscopy
176	Automatic Defect Review AFM for Hard Disk Media and Substrates Nanotechnology Solutions Partner For more information: www.parkAFM.com Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Park Systems Scanning probe microscopy Intermolecular forces KLA Tencor Atomic force microscopy Hard disk drive Nanotechnology Computer hardware Science Technology
177	Atomic Force Microscopy Investigation of One-Dimensional Structures Utilizing the XE-series Instruments Case Study: Zinc Oxide Nanorod General Considerations Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Scanning probe microscopy Electron microscopy Intermolecular forces Nanoelectronics Atomic force microscopy Zinc oxide Nanorod Park Systems Nanowire Chemistry Scientific method Science
178	Chemical Mechanical Polishing (CMP) Metrology with Advanced Surface Profiler >>> Figure 1. The key matrices of metal chemical mechanical Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemical-mechanical planarization Science Park Systems Wafer Profilometer Atomic force microscopy 1 micrometre Semiconductor device fabrication Technology Materials science
179	AFM for biological applications LIFE setup and measuring head lifting mechanism Development of an AFM for biological applications is always a tricky problem because it requires AFM integration with an Inverted Light Mi Add to Reading List Source URL: www.ntmdt.ru Language: English - Date: 2012-12-13 04:14:09 Microbiology Microscopy Magnetic force microscope Microscope Optical microscope Kelvin probe force microscope Atomic force microscopy Vibrational analysis with scanning probe microscopy Scanning probe microscopy Science Chemistry
180	Flexible integrated research AFM OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniqu Add to Reading List Source URL: www.ntmdt.ru Language: English - Date: 2012-12-28 07:31:35 Chemistry Magnetic force microscope Microscopy Microscope Kelvin probe force microscope Atomic force microscopy Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method

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